Pedro C, Cachisso Bambo Donça M, Inácio Somueque S, Eulário Lampi Dique J, Candido Bambo E, Victor Colial H, Calton Alexandre D, Tualibo Gimo S, Amadeu Faife Divage B, Margarida Rodrigues Rico D, de Paiva Barbosa I, Felizmino V, Inácio Serrote R, António Alfina Moisés Y, Rafael Amós N. VARIABILITY, SIMILARITY NETWORK AND GENOTYPIC PATH ANALYSIS OF COMMON BEAN YIELD TRAITS. Functional Plant Breeding Journal [Internet]. 28Sep.2022 [cited 8Dec.2023];4(2). Available from: http://fpbjournal.com/fpbj/index.php/fpbj/article/view/154